Improving and optimizing reliability in future technologies with high-κ dielectrics
- Barry P. Linder
- Eduard Cartier
- et al.
- 2013
- VLSI-TSA 2013
Publications
Date
Featured collections
Popular topics
3 results at VLSI-TSA 2013
Device design considerations for next generation CMOS technology: Planar FDSOI and FinFET (Invited)
- Bruce Doris
- Kangguo Cheng
- et al.
- 2013
- VLSI-TSA 2013
A perspective on future nanoelectronic devices
- Tak H. Ning
- 2013
- VLSI-TSA 2013