K. Michielsen, H. De Raedt, et al.
Physical Review Letters
Paper
3D-XY critical behavior in La2-xSrxCuO4 thin films probed by penetration depth measurement
Abstract
We sketch the evidence for anisotropic 3D-XY critical behavior in La2-xSrxCuO4 thin films and explore the implications of this scenario, supplemented by the experimental phase transition line.
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