A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
A transmission electron microscope imaging and diffraction investigation has been performed on small CrO2 crystallites. The acieular crystal morphology has been observed and electron-diffraction evidence is presented which indicates the presence of a very thin CrO(OH) layer of 6-13 A. CrO2 has been partly converted topotactically to orthorhombic CrO(OH) in hot water and single-crystal electron-diffraction evidence is used to establish this topotactic relationship. Under sufficiently high temperatures or electron-beam irradiation, CrO2 and CrO(OH) convert topotactically to Cr2O3, as seen from single-crystal electron-diffraction data. This last conversion is further characterized using high-resolution dark-field microscopy which reveals the presence of interference patterns from the formation of microcrystalline domains. © 1980 Taylor & Francis Group, LLC.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
P.C. Pattnaik, D.M. Newns
Physical Review B
Ronald Troutman
Synthetic Metals