The observation of various grain boundary atomic structures in Au by high-resolution electron microscopy
- William Krakow
- David A. Smith
- 2011
- Journal of Materials Research
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40 results for William Krakow
Possible Evidence for Overcoordination at Semiconductor Grain Boundaries
- W. Krakow
- A.A. Levi
- et al.
- 2011
- Journal of Materials Research
Epitaxial growth of C60 thin films on mica
- W. Krakow
- N.M. Rivera
- et al.
- 2011
- Journal of Materials Research
Atomic structure of a Σ = 21 grain boundary
- William Krakow
- 2011
- Journal of Materials Research
Detection of extended interstitial chains in ion-damaged silicon
- T.Y. Tan
- H. Föll
- et al.
- 2008
- Applied Physics Letters
Electron microscope studies of the structure and propagation of the Pd2Si/(111)Si interface
- D. Cherns
- D.A. Smith
- et al.
- 2006
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
A fine-particle transmission electron microscope investigation of CrO2 and CrO(OH)
- William Krakow
- Hendrik Colijn
- et al.
- 2006
- Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties
The use of histograms for transmission electron microscopy: Defocus and astigmatism correction at high resolution
- William Krakow
- 2005
- Journal of Electron Microscopy Technique
Real time uses of color for electron microscopy via a television‐rate digital frame store
- William Krakow
- 2005
- Journal of Electron Microscopy Technique
Evaluation of high‐resolution electron microscopy as a method for studying Y‐Ba‐Cu‐O superconductors
- William Krakow
- Thomas M. Shaw
- 2005
- Journal of Electron Microscopy Technique