PaperPower analysis of strained-Si devices/circuitsKeunwoo Kim, Rajiv V. Joshi, et al.Solid-State Electronics
Conference paperPerformance assessment of scaled strained-Si channel-on-insulator (SSOI) CMOSKeunwoo Kim, Ching-Te Chuang, et al.IEEE International SOI Conference 2002
PaperTurning silicon on its edgeEdward J. Nowak, Ingo Aller, et al.IEEE Circuits and Devices Magazine
PaperBipolar Transistor with Self-Aligned Lateral ProfileG.P. Li, Tze-Chiang Chen, et al.IEEE Electron Device Letters
