Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
The new complex yttrium benzoylpivaloylmethanide and its acetonitrile adduct have been characterized by IR, NMR, mass spectroscopy, X-ray structure analysis, and thermogravimetric/differential thermal analysis. In situ flux measurements and mass spectroscopic studies have been performed to test the suitability of this compound as a precursor for the deposition of complex oxide thin films under molecular beam conditions. Finally it has been used to deposit epitaxial Y2O3 (001) thin films on SrTiO3 (001) substrates.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
R. Ghez, M.B. Small
JES
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
Frank Stem
C R C Critical Reviews in Solid State Sciences