IEE/LEOS Summer Topical Meetings 1991

Conference paper

29 Jul 1991

Characterization of dry etch induced in III/V micro-structures

View publication

Abstract

No abstract available.

Related

Paper

Time resolved spectroscopy on etched GaAs/GaAlAs-quantum-microstructures

Paper

Time-resolved investigations of sidewall recombination in dry-etched GaAs wires

Paper

CW and time resolved luminescence study of dry etch damage in semiconductor wires

Conference paper

Study of vertical transport through schottky-gated, laterally confined quantum-dot devices

View all publications