F.M. D'Heurle
MRS Fall Meeting 1995
The effect of the mechanical constraints exerted by coatings upon electromigration in thin films is evaluated on the basis of known pressure effects upon diffusion. © 1972 The American Institute of Physics.
F.M. D'Heurle
MRS Fall Meeting 1995
F.M. D'Heurle
Journal de physique. Colloque
J.E.E. Baglin, F.M. D'Heurle, et al.
Journal of Applied Physics
O.C. Wells, P. Coane, et al.
Microbeam Analysis 1982