M. Murakami, P. Chaudhari
Thin Solid Films
Volterra edge dislocations were introduced in an amorphous Lennard-Jones model. By application of suitable boundary conditions, equivalent to a shear stress, a recognizable step with a shape of a double-headed asymptote was formed on the other side of the amorphous solid. This suggests that atomic transport via dislocation motion can occur and could be the mechanism of shear-band formation in real amorphous materials. © 1983 The American Physical Society.
M. Murakami, P. Chaudhari
Thin Solid Films
P. Chaudhari
Journal of Applied Physics
D. Dimos, P. Chaudhari, et al.
Physical Review B
L.T. Shi
Materials Chemistry and Physics