Narendra Parihar, Uma Sharma, et al.
IEEE T-ED
In spite of 50 years of history, there is still no consensus on the basic physics of Negative Bias Temperature Instability. Two competing models, Reaction-Diffusion and Defect-Centric, currently vie for dominance. The differences appear fundamental: one model holds that NBTI is a diffusion-limited process and the other holds that it is reaction-limited. Basic issues of disagreement are summarized and the main controversial aspects of each model are reviewed and contrasted.
Narendra Parihar, Uma Sharma, et al.
IEEE T-ED
Barry P. Linder, Salvatore Lombardo, et al.
IEEE Electron Device Letters
Narendra Parihar, Richard G. Southwick, et al.
IEDM 2017
Soon-Cheon Seo, Chih-Chao Yang, et al.
IITC 2009