Core- and valence-electron spectra of clean Si surfaces by energy loss spectroscopy

T.N. Morgan

Semiconductor Science and Technology

R.D. Murphy, R.O. Watts

Journal of Low Temperature Physics

Revanth Kodoru, Atanu Saha, et al.

arXiv

M. Hargrove, S.W. Crowder, et al.

IEDM 1998