A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
The CrLVV Auger emission has been used to investigate the local chemical environment of Cr(VI) in connection with the photoreduction produced by a non-monochromatic X-ray source. We compared Cr(VI) in oxides on anodized Al exposed to a chromate solution, with Cr(VI) in oxides on Al/Cr alloys polarized in a borate solution. The former were found to be much more sensitive to photoreduction than the latter. This is correlated with the intensity of the CrLVV Auger emission, attributed to a charge transfer transition in the final state of the photoemission process. © 1991.
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
R.W. Gammon, E. Courtens, et al.
Physical Review B
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997