Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Contrary to previous knowledge, we have found an ordered 3×3R30° surface reconstruction on the cleaved Si(111) surface after room-temperature deposition of one monolayer of Cs. The preparation and characterization of this surface, and the dispersion of the lowest unoccupied surface-state band as measured with angle-resolved inverse photoemission spectroscopy are presented. The surface is observed at the saturation of the work function and found to be semiconducting. © 1989 The American Physical Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
K.A. Chao
Physical Review B
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
R. Ghez, M.B. Small
JES