Detecting and preventing measurement errors

Keith A. Jenkins

doi:10.1109/54.632884

IEEE Design and Test of Computers

Paper

01 Oct 1997

Detecting and preventing measurement errors

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Abstract

Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.

Paper

Time-resolved measurements of self-heating in SOI and strained-silicon MOSFETs using photon emission microscopy

Stas Polonsky, Keith A. Jenkins

IEEE Electron Device Letters

Conference paper

A circuit-sensitive methodology for evaluating substrate noise

John Liobe, Keith A. Jenkins

RFIC 2005

Conference paper

On-chip circuit for monitoring frequency degradation due to NBTI

Kevin Stawiasz, Keith A. Jenkins, et al.

IRPS 2008

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The clock distribution of the Power4 microprocessor

Phillip J. Restle, Craig A. Carter, et al.

Digest of Technical Papers-IEEE International Solid-State Circuits Conference

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Abstract

Related

Time-resolved measurements of self-heating in SOI and strained-silicon MOSFETs using photon emission microscopy

A circuit-sensitive methodology for evaluating substrate noise

On-chip circuit for monitoring frequency degradation due to NBTI

The clock distribution of the Power4 microprocessor