Jonghae Kim, Jean-Olivier Plouchart, et al.
RFIC 2003
Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.
Jonghae Kim, Jean-Olivier Plouchart, et al.
RFIC 2003
Keith A. Jenkins, P. Restle, et al.
VTS 2013
Albert J. Fixl, Keith A. Jenkins
Microelectronic Engineering
Joachim N. Burghartz, D. Edelstein, et al.
IEEE Journal of Solid-State Circuits