Detecting and preventing measurement errors

Keith A. Jenkins

doi:10.1109/54.632884

IEEE Design and Test of Computers

Paper

01 Oct 1997

Detecting and preventing measurement errors

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Abstract

Modern e-beam probers may be as convenient to use as oscilloscopes, but their measurements can be misleading or even erroneous. The author warns of potential problems and suggests ways to prevent and cure faulty readings.

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Abstract

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High-performance three-dimensional on-chip inductors in SOI CMOS technology for monolithic RF circuit applications

When are transmission-line effects important for on-chip interconnections?

Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection

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