Understanding and Measuring the Jitter Generated by Digital CMOS Gates
- Keith A. Jenkins
- 2024
- CSSP
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236 results for Keith A. Jenkins
Limits to Jitter in Digital CMOS Gates
- Keith A. Jenkins
- 2023
- IEEE SSC-L
Measurement of Self-Heating of High-Frequency CMOS Clock Buffers
- Keith A. Jenkins
- Alan J. Weger
- 2022
- IEEE Electron Device Letters
Pulse-Train Method to Measure Transient Response of Field-Effect Transistors
- Keith A. Jenkins
- Eduard Cartier
- et al.
- 2019
- IEEE Electron Device Letters
AC device variability in high-κ Metal-Gate CMOS Technology
- Keith A. Jenkins
- Karthik Balakrishnan
- et al.
- 2019
- IEEE Electron Device Letters
Effect of HCI degradation on the variability of MOSFETS
- C. Zhou
- Keith A. Jenkins
- et al.
- 2018
- IRPS 2018
Estimating transistor channel temperature using time-resolved and time-integrated NIR emission
- Franco Stellari
- Alan J. Weger
- et al.
- 2018
- IRPS 2018
Flexible CMOS integrated circuits based on carbon nanotubes with sub-10 ns stage delays
- Jianshi Tang
- Qing Cao
- et al.
- 2018
- Nature Electronics
Electron mobility in thin In0.53Ga0.47As channel
- Eduard Cartier
- Amlan Majumdar
- et al.
- 2017
- ESSDERC 2017
High-speed logic integrated circuits with solution-processed self-assembled carbon nanotubes
- Shu Jen Han
- Jianshi Tang
- et al.
- 2017
- Nature Nanotechnology