A. Gangulee, F.M. D'Heurle
Thin Solid Films
Dhdelectric characteristics were determined for a microstructurally anisotropic borosilicate glass prepared by uniaxiallhd stretching phase‐separated glass rods. The specimen showed a dielectric loss peak caused by the inhomogeneous microstructure; its magnitude varied with the orientation of the specimen with respect to the electric field direction. The results are in agreement with Sillars’ theory. Copyright © 1981, Wiley Blackwell. All rights reserved
A. Gangulee, F.M. D'Heurle
Thin Solid Films
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
E. Burstein
Ferroelectrics
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011