Microscopy and Microanalysis

Paper

01 Nov 2002

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Abstract

No abstract available.

Paper

Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

Oliver C. Wells, Maurice McGlashan-Powell, et al.

Scanning

Review

Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

Oliver C. Wells

Scanning

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Kenneth C.A. Smith, Oliver C. Wells, et al.

IC-CPO 2006

Paper

XY table and tilting stage for scanning electron microscope (SEM)

Oliver C. Wells

Review of Scientific Instruments

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