Dissociation kinetics of hydrogen-passivated (100) Si SiO₂ interface defects

William G. Van der Sluys, Alfred P. Sattelberger, et al.

Polyhedron

Shiyi Chen, Daniel Martínez, et al.

Physics of Fluids

R.M. Macfarlane, R.L. Cone

Physical Review B - CMMP

Surendra B. Anantharaman, Joachim Kohlbrecher, et al.

MRS Fall Meeting 2020