IEEE Design and Test of Computers

Paper

01 Jan 1990

Embedded totally self-checking checkers: A practical design

View publication

Abstract

No abstract available.

Related

Paper

An incremental algorithm for identification of longest (shortest) paths

Sandip Kundu

Integration, the VLSI Journal

Paper

An efficient technique for obtaining unate implementation of functions through input encoding

Sandip Kundu

Integration, the VLSI Journal

Paper

Robust tests for parity trees

Sandip Kundu, Sudhakar M. Reddy

Journal of Electronic Testing

Paper

Diagnosing Scan Chain Faults

Sandip Kundu

IEEE Transactions on VLSI Systems

View all publications