O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Using thermal co-evaporation we have prepared epitaxial Cu 2ZnSnS4 (CZTS) films on Si(001) substrates. A substrate temperature as high as 370 C and proper substrate cleaning (HF-dip followed by thermal desorption of surface hydrogens) are found to be necessary for the epitaxial growth. Detailed transmission electron microscopy measurements and X-ray diffraction studies are used to reveal the orientation relation of the CZTS films with the underlying silicon substrate, and the formation of defects within the CZTS layer. © 2014 Elsevier B.V.
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
R.W. Gammon, E. Courtens, et al.
Physical Review B
Ronald Troutman
Synthetic Metals
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications