T.F. Kuech, D.J. Wolford, et al.
Applied Physics Letters
The reliability of molten KOH for revealing dislocations intersecting {100} faces of GaAs has been tested using transmission x-ray topography. It is found to be a "faithful" etch.
T.F. Kuech, D.J. Wolford, et al.
Applied Physics Letters
T.F. Kuech, E.D. Marshall, et al.
Journal of Crystal Growth
M.B. Small, R.M. Potemski
Journal of Crystal Growth
M.S. Goorsky, T.F. Kuech, et al.
Applied Physics Letters