Microscopy and Microanalysis

Paper

15 Jul 2003

Experience with the IBM sub-angstrom STEM

Abstract

No abstract available.

Paper

Silicon L_{2, 3} near-edge fine structure in confined volumes

P.E. Batson

Ultramicroscopy

Conference paper

Aberration correction results in the IBM STEM instrument

P.E. Batson

Ultramicroscopy

Paper

Local bonding and electronic structure obtained from electron energy loss scattering

P.E. Batson, K.L. Kavanagh, et al.

Ultramicroscopy

Paper

High-energy resolution electron spectrometer for 1-nm spatial analysis

P.E. Batson

Review of Scientific Instruments

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