William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Both photon-assisted-tunneling and internal photoemission measurements have been made on the same metal-oxide-semiconductor samples. The effective barrier heights between the metal (Al or Au) and the oxide (SiO2) extracted from the internal photoemission measurements are found to be larger by 0.3 eV than the effective barrier heights extracted from the photon-assisted-tunneling measurements. Only the quantum-mechanical image-force theory is capable of explaining this result. © 1982 The American Physical Society.
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
John G. Long, Peter C. Searson, et al.
JES
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures