Parameter Dependence of RIE Induced Radiation Damage in Silicon Dioxide
- L.M. Ephrarh
- D.J. Dimaria
- et al.
- 2019
- JES
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119 results for D.J. DiMaria
(Invited) charge trapping in thermal silicon dioxide
- D.J. Dimaria
- 2014
- Japanese Journal of Applied Physics
Interface effects and high conductivity in oxides grown from polycrystalline silicon
- D.J. Dimaria
- D.R. Kerr
- 2008
- Applied Physics Letters
Hole injection into silicon nitride: Dark current dependence on electrode materials and insulator thickness
- P.C. Arnett
- D.J. DiMaria
- 2008
- Applied Physics Letters
Hole injection into silicon nitride: Interface barrier energies by internal photoemission
- D.J. Dimaria
- P.C. Arnett
- 2008
- Applied Physics Letters
Contact currents in silicon nitride
- P.C. Arnett
- D.J. Dimaria
- 2008
- Journal of Applied Physics
Determination of insulator bulk trapped charge densities and centroids from photocurrent-voltage charactersitcs of MOS structures
- D.J. DiMaria
- 2008
- Journal of Applied Physics
Capture of electrons into Na+-related trapping sites in the SiO2 layer of MOS structures at 77 °K
- D.J. DiMaria
- J.M. Aitken
- et al.
- 2008
- Journal of Applied Physics
Effects of electron-beam irradiation on the properties of CVD Si 3N4 films in MNOS structures
- T.P. Ma
- B.H. Yun
- et al.
- 2008
- Journal of Applied Physics
Use of electron-trapping region to reduce leakage currents and improve breakdown characteristics of MOS structures
- D.J. Dimaria
- D.R. Young
- et al.
- 2008
- Applied Physics Letters