PaperA new two-dimensional particle detector for a toroidal electrostatic analyzerR.M. Tromp, M. Copel, et al.Review of Scientific Instruments
PaperPhysical characterization of sub-32-nm semiconductor materials and processes using advanced ion beam-based analytical techniquesM. Hopstaken, D. Pfeiffer, et al.Surface and Interface Analysis
PaperAtomic beam deposition of lanthanum- and yttrium-based oxide thin films for gate dielectricsS. Guha, E. Cartier, et al.Applied Physics Letters
PaperIntrinsic instability of aberration-corrected electron microscopesS.M. Schramm, S.J. Van Der Molen, et al.Physical Review Letters
