Conference paper
Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Nuclear magnetic resonance studies of 19F in paramagnetic CeF3 show the ionic diffusion observed earlier in LaF3 and confirm the D43d (P3cl) crystal structure proposed by X-ray measurements. Between 245° K and 500°K, the ionic diffusion is due to the relatively rapid motion of fluorine ions in g sites, with EA = 0.13 eV, D0 = 1.7 × 10-9 cm2/sec and τc = 16μsec. © 1969.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
R. Ghez, M.B. Small
JES
K.N. Tu
Materials Science and Engineering: A
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials