Appl Stochastic Models Bus Indus

Editorial

27 Apr 2020

Foreword: Special issue on statistics in quality, industry, and technology

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Paper

Inference about defects in the presence of masking

Betty J. Flehinger, Benjamin Reiser, et al.

Technometrics

Paper

Likelihood ratio methods for monitoring parameters of a nested random effect model

Emmanuel Yashchin

JASA

Conference paper

Accelerated Monte Carlo for Kullback-Leibler divergence between Gaussian mixture models

Jia-Yu Chen, John R. Hershey, et al.

ICASSP 2008

Conference paper

Virtual metrology and run-to-run control in semiconductor manufacturing

Yada Zhu, Robert J. Baseman, et al.

ISSAT-RQD 2012

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