Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

View publication

Abstract

No abstract available.

Paper

Comparison of different models for the generation of electron backscattering patterns in the scanning electron microscope

Oliver C. Wells

Scanning

Paper

Low-loss electron images of uncoated photoresist in the scanning electron microscope

Oliver C. Wells

Applied Physics Letters

Paper

Examination of uncoated photoresist by the low-loss electron method in the scanning electron microscope

Oliver C. Wells, Ping-Chin Cheng

Journal of Applied Physics

Paper

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Oliver C. Wells

Microscopy and Microanalysis

View all publications