Thermal instability of the Cu-Ni interface above 200°C
T.H. Westmore, J.E.E. Baglin, et al.
MRS Spring Meeting 1998
This paper summarizes reports and opinions presented during a Roundtable Session of the same title at the 13th International Conference on Ion Beam Analysis, Lisbon, 1997. The evolution of new technologies and new fields of research is creating new demands for advanced materials analysis, often at a level not attainable with current techniques. We therefore explore some opportunities for creative development of new or enhanced ion beam techniques to satisfy major predictable needs of the future. In particular, new analytical applications are discussed for the semiconductor industry, for biomedical research, and for advanced research in minerals and geoscience. © 1998 Elsevier Science B.V.
T.H. Westmore, J.E.E. Baglin, et al.
MRS Spring Meeting 1998
A.J. Kellock, M.H. Tabacniks, et al.
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
S. Petersson, R.L. Anderson, et al.
Journal of Applied Physics
B. Hermsmeier, C.R. Brundle, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films