T.M. Shaw, S.A. Shivashankar, et al.
Physical Review B
Multilayer films of [Co 10 Å/Cu(t)]64 with copper thicknesses from t=10 to 29 Å annealed for 1 h at temperatures about 350°C showed a decrease in sample resistivity at 4.2 K. The giant magnetoresistance (GMR) maximums for as-deposited films at t=10 Å and t=23 Å shifted with annealing. The GMR decreased for t=10 Å and t=23 Å but increased for t=19 Å and t=29 Å indicating a complex behavior with annealing. Similarities with granular films are discussed.
T.M. Shaw, S.A. Shivashankar, et al.
Physical Review B
J.M.E. Harper, K.P. Rodbell
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
J.M.E. Harper, C. Cabral Jr., et al.
Annual Review of Materials Science
R.J. Gambino, T.R. McGuire, et al.
IEEE Transactions on Magnetics