Hon-Sum Philip Wong, Yuan Taur, et al.
Microelectronics Reliability
We report electrical measurements of the radio frequency response of carbon nanotube field-effect transistors (CNFETs). The very low current drive of CNFETs makes conventional high-frequency measurements difficult. To overcome this problem, we have used a novel approach to easily measure the response up to 250 MHz in nonoptimized experimental conditions. We observe a clear response of our CNFETs with no deterioration in signal up to at least 250 MHz, which is the limit for our present configuration.
Hon-Sum Philip Wong, Yuan Taur, et al.
Microelectronics Reliability
Saibal Mukhopadhyay, Keunwoo Kim, et al.
IEEE Electron Device Letters
Hiroshi Miki, Naoki Tega, et al.
IEDM 2010
M. Zhang, J. Knoch, et al.
IEEE Electron Device Letters