IBM experiments in soft fails in computer electronics (1978-1994)

J.F. Ziegler; H.W. Curtis; H.P. Muhlfeld; C. Montrose; B. Chin; M. Nicewicz; C.A. Russell; W.Y. Wang; L.B. Freeman; P. Hosier; L.E. LaFave; J.L. Walsh; J.M. Orro; G.J. Unger; J.M. Ross; T.J. O&#039;Gorman; B. Messina; T.D. Sullivan; A.J. Sykes; H. Yourke; T.A. Enger; V. Tolat; T.S. Scott; A.H. Taber; R.J. Sussman; W.A. Klein; C.W. Wahaus

doi:10.1147/rd.401.0003

IBM J. Res. Dev

Paper

01 Jan 1996

IBM experiments in soft fails in computer electronics (1978-1994)

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Abstract

This historical review covers IBM experiments in evaluating radiation-induced soft fails in LSI electronics over a fifteen-year period, concentrating on major scientific and technical advances which have not been previously published.

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