Properties of SiO2 Grown in the Presence of HCl or Cl2
- Y.J. van der Meulen
- C.M. Osburn
- et al.
- 2019
- JES
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82 results for James F. Ziegler
Critical angles for channeling of boron ions implanted into single-crystal silicon
- Chanahae Park
- Kevin M. Klein
- et al.
- 2019
- JES
Empirical corrections to the energy loss of 4He ions in oxides
- J.F. Ziegler
- W.K. Chu
- et al.
- 2008
- Applied Physics Letters
Quantitative analysis of complex targets by proton-induced x rays
- W. Reuter
- A. Lurio
- et al.
- 2008
- Journal of Applied Physics
Trace-element analysis of water samples using 700-keV protons
- J. Rickards
- J.F. Ziegler
- 2008
- Applied Physics Letters
An analytic solution to elastic backscattering
- W.K. Chu
- J.F. Ziegler
- 2008
- Journal of Applied Physics
A new concept for solar energy thermal conversion
- J.J. Cuomo
- J.F. Ziegler
- et al.
- 2008
- Applied Physics Letters
Calculations of the energy loss of 4He ions in solid elements
- W.K. Chu
- V.L. Moruzzi
- et al.
- 2008
- Journal of Applied Physics
Tables of stopping cross sections for 4He ions in solids
- J.F. Ziegler
- W.K. Chu
- 2008
- Journal of Applied Physics
New precision technique for measuring the concentration versus depth of hydrogen in solids
- W.A. Lanford
- H.P. Trautvetter
- et al.
- 2008
- Applied Physics Letters