Conference paper
Iddq test: Sensitivity analysis of scaling
T.W. Williams, R.H. Dennard, et al.
IEEE ITC 1996
No abstract available.
T.W. Williams, R.H. Dennard, et al.
IEEE ITC 1996
C.C.-H. Hsu, L.K. Wang, et al.
IRPS 1989
T. Kirihata, M. Gall, et al.
ISSCC 1998
C.C.-H. Hsu, L.K. Wang, et al.
Journal of Electronic Materials