P.F. Lu, J. Warnock
Solid State Electronics
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
P.F. Lu, J. Warnock
Solid State Electronics
J. Warnock, P.F. Lu, et al.
IEDM 1989
Keith A. Jenkins, S. Kim, et al.
ICICDT 2007
D. Singh, Keith A. Jenkins
DRC 2004