M. Hargrove, S.W. Crowder, et al.
IEDM 1998
Paper
Infrared measurement of a Tl2Ba2CaCu2O8-x film
Abstract
A preliminary report of the a-b plane reflectivity of a Tl2Ba2CaCu2O8-x film (Tc ≅ 110K) is presented. The plasma edge occurs at ≅ 2000cm-1, which is quite unexpected because it implies an effective carrier density that is an order of magnitude less than obtained in other high temperature CuO superconductors. © 1989.
Related
Sharee J. McNab, Richard J. Blaikie
Materials Research Society Symposium - Proceedings
Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Z. Schlesinger, S. Allen, et al.
ICPS Physics of Semiconductors 1984