S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
NiMnSb thin films have been etched in plasma chemistries ICl and IBr, under inductively coupled plasma conditions. These interhalogens produce practical etch rates (500-1500 Å/min-1) provided the incident ion energy is above threshold values (∼120 eV for ICl, ∼230eV for IBr) and there is a balance of etch product formation and desorption through control of the ion and reactive neutral fluxes. Both chemistries appear promising for pattern transfer in NiMnSb-based spin polarized magnetic devices. © 1999 The Electrochemical Society. All rights reserved.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
A. Reisman, M. Berkenblit, et al.
JES
Ming L. Yu
Physical Review B
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials