Conference paper
A quantitative analysis of OS noise
Alessandro Morari, Roberto Gioiosa, et al.
IPDPS 2011
Paper
Introduction to Special Issue: The OOPSLA'92 Educators’ Symposium
Abstract
No abstract available.
Related
Chidanand Apté, Fred Damerau, et al.
ACM Transactions on Information Systems (TOIS)
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007