PaperCurrent saturation in submicrometer graphene transistors with thin gate dielectric: Experiment, simulation, and theoryShu-Jen Han, Dharmendar Reddy, et al.ACS Nano
PaperFlip-flop upsets from single-event-transients in 65 nm clock circuitsLarry Wissel, David F. Heidel, et al.IEEE TNS
PaperLong-term NBTI degradation under real-use conditions in IBM microprocessorsPong-Fei Lu, Keith A. Jenkins, et al.Microelectronics Reliability
Conference paperEstimation of heavy-ion LET thresholds in advanced SOI IC technologies from two-photon absorption laser measurementsJames R. Schwank, Marty R. Shaneyfelt, et al.RADECS 2009