Marcel Kossel, Thomas Morf, et al.
IEEE MWCL
Jitter is one of the most important issues in the design and operation of high-speed serial links. This article focuses on the BERT scan method, a jitter characterization method based on scanning the bit-error rate within the eye diagram. © 2004 IEEE.
Marcel Kossel, Thomas Morf, et al.
IEEE MWCL
Martin L. Schmatz, Rik Jongerius, et al.
ICASSP 2014
Thomas Toifl, Christian Menolfi, et al.
IEEE Journal of Solid-State Circuits
Christoph Berger, Urs Bapst, et al.
IEE/LEOS Summer Topical Meetings 2004