Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Neutron scattering techniques have been used to measure the phonon dispersion curves for SmS in both the semiconducting and the metallic mixed-valent state. Large softening of the longitudinal acoustic phonon branches was found in the mixed-valent state, particularly for the [111] direction. It is apparent there is a strong coupling between the valence fluctuations and the phonons in the mixed-valent phase of SmS. © 1982 The American Physical Society.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Mark W. Dowley
Solid State Communications