Jerry Lo, C. Hwang, et al.
IEEE Transactions on Magnetics
The advantages of using monochromatic and parallel synchrotron x rays for the microstructure analysis of polycrystalline materials have been studied. Analysis of line broadening from Pd powers showed encouraging results. Warren-Averbach analysis [J. Appl. Phys. 21, 595 (1950)] with respect to the three major crystal axes [111], [100], and [110] was done using 1-Å x rays. Crystallite sizes and microstrains relative to the [111] direction were obtained using three different reflection pairs (111)-(222), (111)-(333), and (111)-(444). The fixed symmetrical instrument profile shape has major advantages in the correction of instrumental broadening and the determination of a low level (10-4 range) of stacking-fault probabilities.
Jerry Lo, C. Hwang, et al.
IEEE Transactions on Magnetics
P. Lacorre, J.B. Torrance, et al.
Journal of Solid State Chemistry
W.-Y. Lee, Graham Olive, et al.
Thin Solid Films
D.Y. Yoon, M. Ree, et al.
International Conference on Polyimides 1988