Characterization of CoCrTa Alloy Thin Films by X-Ray Powder Diffraction
- T.C. Huang
- 2013
- Powder Diffraction
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X-Ray Powder Diffraction Analysis of a Nonlinear Optical Material 4-(N, N-dimethylamino)-3-acetamidonitrobenzene
- T.C. Huang
- R. Karimi
- et al.
- 2013
- Powder Diffraction
Powder diffraction analysis of a photoconductor material p-diethylaminobenzaldehyde diphenylamine hydrazone
- T.C. Huang
- P.W. Wang
- 2013
- Powder Diffraction
Synthesis and X-Ray Powder Diffraction Analysis of a New Metallic (but not Superconducting) Copper Oxide: La1.67Sr0.33Cu2O5
- T.C. Huang
- A. Nazzal
- et al.
- 2013
- Powder Diffraction
A study of the superconducting La2-xSrxCuO4 system by x-ray powder diffraction
- Y. Tokura
- J.B. Torrance
- et al.
- 2013
- Powder Diffraction
Analysis of X-Ray Powder Diffraction Patterns of Perovskite-Like PrNiO3
- T.C. Huang
- W. Parrish
- et al.
- 2013
- Powder Diffraction
X-ray depth profiling of iron oxide thin films
- Michael F. Toney
- Ting C. Huang
- et al.
- 2011
- Journal of Materials Research
Thin‐film characterization by x‐ray fluorescence
- T.C. Huang
- 2005
- X‐Ray Spectrometry
Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2
- T.C. Huang
- 2005
- X‐Ray Spectrometry
Profile analysis of experimental x‐ray fluorescence spectra
- T.C. Huang
- G. Lim
- 2005
- X‐Ray Spectrometry