PaperLow-loss electron images of uncoated photoresist in the scanning electron microscopeOliver C. WellsApplied Physics Letters
PaperReduction of penetration effect at sharp edges in the scanning electron microscope (SEM)Oliver C. Wells, Phillip J. BaileyJournal of Microscopy
PaperRelationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic fieldOliver C. Wells, Catherine A. StoyeJournal of Microscopy