Conference paperApplications of image diagnostics to metrology quality assurance and process controlJohn A. Allgair, Victor V. Boksha, et al.SPIE Advanced Microelectronic Manufacturing 2003
PaperReciprocity between the reflection electron microscope and the low-loss scanning electron microscopeOliver C. WellsApplied Physics Letters
PaperSchlieren method as applied to magnetic recording heads in the scanning electron microscopeOliver C. Wells, Matthias BrunnerApplied Physics Letters
ReviewEffects of collector take‐off angle and energy filtering on the BSE image in the SEMOliver C. WellsScanning
