Joong-ho Choi, D.L. Rogers, et al.
OFC 1996
High-performance interdigitated metal-semiconductor-metal detectors and photoreceivers have been fabricated using a standard refractory-gate, ion-implanted MESFET process which was also used to fabricate complex digital circuits. A rise time of 110 ps has been observed for a detector-preamplifier combination, implying a small-signal bandwidth of about 3 GHz. Detector responsivities as high as 0. 45 A/W, and dark currents as low as 5 nA have been observed.
Joong-ho Choi, D.L. Rogers, et al.
OFC 1996
D.L. Rogers, J. Woodall, et al.
IEEE T-ED
M.B. Ritter, F.R. Gfeller, et al.
ISSCC 1996
M. Yang, J. Schaub, et al.
VLSI Technology 2003