Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001
Michiel Sprik
Journal of Physics Condensed Matter
Q.R. Huang, Ho-Cheol Kim, et al.
Macromolecules
P.C. Pattnaik, D.M. Newns
Physical Review B