A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME