Hiroshi Ito, Reinhold Schwalm
JES
A field effect transistor device (FET), consisting of a nonlinear Mott Insulator channel material, and a high dielectric-constant gate oxide, is explored as a nanoscale device. Experimental functionality of a large scale prototype (5 μm channel length) has been demonstrated. The underlying physics of the device is analyzed and modeled using a time-dependent Hartree approach. Timing estimates suggest a relatively short switching time.
Hiroshi Ito, Reinhold Schwalm
JES
Thomas H. Baum, Carl E. Larson, et al.
Journal of Organometallic Chemistry
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Lawrence Suchow, Norman R. Stemple
JES