R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Neutron reflectivity (NR) and dynamic secondary ion mass spectroscopy (DSIMS) were used to study compositional variations as a function of film depth in thin polymeric nanofoam films formed from triblock copolymers containing 15 wt%, 13 kg/mol polypropylene oxide end blocks with a fluorinated polyimide center block. The triblock copolymer films were spun cast and imidized on silicon substrates and showed an excess amount of polyimide present at both the air/film and film/substrate interfaces. Upon foaming the films showed a slight densification, and the formation of a 50- 150 Å thick polyimide skin at the air interface. The final nanofoam materials had a calculated porosity of roughly 20 vol.% in the center portion of the film. (C) 1999 Elsevier Science Ltd.
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
A. Gangulee, F.M. D'Heurle
Thin Solid Films
J.H. Stathis, R. Bolam, et al.
INFOS 2005