X. Su, C.B. Stagarescu, et al.
Applied Physics Letters
Paper
Observation of columnar microstructure in step-graded Si1-xGex/Si films using high-resolution X-ray microdiffraction
Abstract
High angular resolution x-ray microdiffraction was used to determine columnar microstructure in step-graded Si1-xGex/Si(001) structures with low threading dislocation densities. Experiments were performed with a high brilliance x-ray undulator source at the 2-ID-D end station. Rectangular columnar micrograins were found with average widths from ∼0.6 to ∼3.7 μm. Many sharp peaks of a 3- μm-thick strain-relaxed Si0.83Ge0.17 film were observed using x-ray rocking curves.
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