Conference paper
Design of TSC checkers for implementation in CMOS technology
Sandip Kundu, Sudhakar M. Reddy
ICCD 1989
Tests that detect modeled faults independent of the delays in the circuit under test are called robust tests. An integrated approach to the design of combinational logic circuits in which all single stuck-open faults and path delay faults are detectable by robust tests was presented by the authors earlier. It is shown here that the earlier design actually results in circuits in which all multiple stuck-at and stuck-open and multipath delay faults are robustly testable. The tests to detect such faults are presented.
Sandip Kundu, Sudhakar M. Reddy
ICCD 1989
Sandip Kundu, Leendert M. Huisman, et al.
IEEE ITC 1992
D. Brand, A.D. Drumm, et al.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Sandip Kundu
ICCD 1994